Thickness-dependent thermal properties of amorphous insulating thin films measured by photoreflectance microscopy

Thin Solid Films

Journal Article

G. Tessier

R. Ritasalo

M. Matvejeff

J. Stormonth-Darling

P.S. Dobson

P.O. Chapuis

S. Gomès

J.P. Roger

Publication

Year of publication: 2017

Volume: 642

Pages: 157--162

Identifiers

ISSN: 0040-6090

Other: cv-prod-id-2553744

Locators

DOI: 10.1016/j.tsf.2017.09.037

Alternative Titles